Thermal stress analysis of Ge1Sb4Te7-based phase-change memory devices | |
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Publication Year | 2011 |
Journal Name | IEEE Transactions on Electron Devices |
Volume Number | 58 |
Page Number | 782-791 |
Author | Sangwoo Shin, Kyung Min Kim, Jiwoon Song, Hyung Keun Kim, Doo Jin Choi, Hyung Hee Cho |