| Thermal stress analysis of Ge1Sb4Te7-based phase-change memory devices | |
|---|---|
| Publication Year | 2011 |
| Journal Name | IEEE Transactions on Electron Devices |
| Volume Number | 58 |
| Page Number | 782-791 |
| Author | Sangwoo Shin, Kyung Min Kim, Jiwoon Song, Hyung Keun Kim, Doo Jin Choi, Hyung Hee Cho |
Publication
Heat Transfer Laboratory
- Publication
- International journal
International journal